News & Events
- Applying slope constrained Q-type aspheres to develop higher performance lenses
- Mobile device camera design with Q-type polynomials to achieve higher production yield
- Angular scan optical coherence tomography imaging and metrology of spherical gradient refractive index preforms
- Volumetric rendering and metrology of spherical gradient refractive index lens imaged by angular scan optical coherence tomography system
- Design, fabrication, and testing of convex reflective diffraction gratings
- Mathematical Properties of Describing Freeform Optical Surfaces with Orthogonal Bases
- Freeform spectrometer enabling increased compactness
- Thompson Award Nomination Deadline October 11th
- CeFO’s Joseph Owen is Making a Career of Freeform Optics
- UNC Charlotte’s CeFO Team Have Been Pioneers in Freeform Optics for Over 10 Years
- Lighting the Way with Freeform Optics
- Spotlight on CeFO: Freeform Spectrometer Design Innovation
- CeFO is Pleased to Announce UTC Aerospace Systems as Our Newest Member!
- Jannick Rolland Receives Edmund A. Hajim Outstanding Faculty Award
- CeFO Welcomes LightPath Technologies as Our Newest Member!
- Emerging CeFO Success Story: Miniature Imaging Spectrometer
- Michael Kidger Memorial Scholarship: 2017 AWARDEE – JONATHAN PAPA
- NSF CAREER Award
- OptiPro Receives Tibbetts Award in 2017 White House Ceremony
- As Center for Freeform Optics Grows, So Do Opportunities for Students
- POCO Graphite, an Entegris company, joins CeFO
- Call for Abstracts: OSA Optical Design and Fabrication Congress
- Strehl ratio as the Fourier transform of a probability density of error differences
- Optical differentiation wavefront sensing with binary pixelated transmission filters
- Optimization of femtosecond laser processing of silicon via numerical modeling
- Call for Papers: ASPEN/ASPE Spring 2017 Topical Conference
- Evaluation of fiber-based polishing tools
- Stephen Burns to Become Professor Emeritus
- Nikon Research Corporation of America Joins CeFO
- L-3 Communications Joins CeFO
- Center for Freeform Optics (CeFO) IAB Meeting
- SPIE Photonics West Conference
- Eminess Joins CeFO
- Corning Joins CeFO
- Magnetorheological finishing of CVD zinc sulfide
- Open questions in surface topography measurement: a roadmap
- Jet Propulsion Laboratory Joins CeFO
- Freeform electronic viewfinder
- Manufacturing and measurement of freeform optics
- Invitation for Conference Papers
- Diamond flycutting of chalcogenide glass
- SPIE OPTIFAB Conference
- Short Course on Freeform Optics at OPTIFAB
- Microsoft joins CeFO
- Reimers Wins Design Competition
- Center for Freeform Optics (CeFO) IAB Meeting
- Eric Schiesser awarded 2015 Michael Kidger Memorial Scholarship
- Diamond machining of chalcogenide glass
- AIM Photonics receives $110M federal funding
- ODF ’16
- SPIE Optics + Photonics 2015
- Freeform Optics Revolution
- Aperture Optical Sciences joins CeFO
- ASPE 2015 Summer Topical Meeting
- Oculus, a division of Facebook, joins CeFO
- Outstanding Dissertation Award to Fuerschbach
- Yao Receives Student Award
- Greg Forbes joins CeFO
- Carl Zeiss AG Joins CeFO
- Center for Freeform Optics (CeFO) IAB Meeting
- Freeform Optics Meeting in Denmark
- OSA Freeform Optics Meeting
- OSA’s First Incubator Meeting
- A Revolution in Imaging Optical Design
- 2014 New CeFO Members
- Theory of aberration fields with freeform surfaces
- SPIE Photonics West 2015
- Frontiers in Optics 2014
- X-ray diffractometer
- Scattering facility
- Micro-optic reflection and transmission interferometer
- Microindenter
- Ellipsometers
- Scanning Tunneling Electron Microscope
- Scanning electron microscope
- Carl Zeiss scanning electron microscope
- Atomic force microscope
- Nanoindenter
- Uniaxial Testing Platform
- X-ray diffraction
- 3D form measurement
- Perkin Elmer Dynamic Mechanical Analyzer
- Non-contact 3D profilometer
- Zygo phase-measuring interferometer
- PerkinElmer FTIR microscope
- Carl Zeiss F25 coordinate measuring machine
- Twyman-Green interferometer
- Laser confocal microscope
- Zygo NewView scanning white light interferometer
- Zygo Verifire MST interferometer
- Zygo Verifire interferometers
- 633 nm interferometer
- Spotlight on Head-Worn Displays
- Overarm polisher
- 6-axis polishing
- Continuous polishing
- E-beam lithography
- 5x stepper
- Ultraform finishing