The Center for Freeform Optics
An Industry/University Cooperative Research Center

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2021

Swain, BR; Dorrer, C.; Qiao, J.

Telephoto-lens-based Optical Differentiation Wavefront Sensor for freeform metrology Journal Article

In: Opt. Express, vol. 29, no. 23, pp. 38395-38403, 2021.

Abstract | BibTeX | Tags: metrology, related

2020

Rosario Porras-Aguilar Ana H. Ramirez-Andrade, Konstantinos Falaggis

Numerical integration of slope data with application to deflectometry Proceeding

vol. 11490, no. 09, 2020.

Links | BibTeX | Tags: metrology

2019

Swain, Biswa Ranjan; Dorrer, Christophe; Qiao, Jie

High-performance optical differentiation wavefront sensing towards freeform metrology Journal Article

In: Opt. Express, vol. 27, no. 25, pp. 36297-36310, 2019.

Abstract | BibTeX | Tags: CeFO related, metrology

Shearing interferometry via geometric phase

BRUNO PICCIRILLO LUIS A. ALEMÁN-CASTANEDA, ENRICO SANTAMATO; ALONSO, MIGUEL A.

Shearing interferometry via geometric phase Journal Article

In: Optica, vol. 6, no. 4, pp. 396-399, 2019.

Abstract | Links | BibTeX | Tags: metrology, related

2018

Point-cloud noncontact metrology of freeform optical surfaces

Yao, Jianing; Anderson, Alexander; Rolland, Jannick P.

Point-cloud noncontact metrology of freeform optical surfaces Journal Article

In: Optics Express, vol. 26, no. 8, pp. 10242-10265, 2018.

Abstract | Links | BibTeX | Tags: metrology, related

Experimental investigation in nodal aberration theory (NAT) with a customized Ritchey-Chrétien system: third-order coma

Zhao, Nan; Papa, Jonathan C.; Fuerschbach, Kyle; Qiao, Yanfeng; Thompson, Kevin P.; Rolland, Jannick P.

Experimental investigation in nodal aberration theory (NAT) with a customized Ritchey-Chrétien system: third-order coma Journal Article

In: Optics Express, vol. 26, no. 7, pp. 8729-8743, 2018.

Abstract | Links | BibTeX | Tags: metrology, related

2017

Twyman effects in thin curved optics

Lambropoulos, John C.

Twyman effects in thin curved optics Proceeding

SPIE, vol. SPIE Vol 10448, no. 104480V (2017), 2017.

Abstract | Links | BibTeX | Tags: CeFO related, metrology

2014

Freeform Optics Metrology Using Optical Coherence Tomography

Yao, Jianing; Rolland, Jannick P.

Freeform Optics Metrology Using Optical Coherence Tomography Conference

Optical Fabrication and Testing, OSA 2014.

BibTeX | Tags: metrology, related