The Center for Freeform Optics
An Industry/University Cooperative Research Center

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2020

Rosario Porras-Aguilar Ana H. Ramirez-Andrade, Konstantinos Falaggis

Numerical integration of slope data with application to deflectometry Proceeding

11490 (09), 2020.

Links | BibTeX | Tags: metrology

2019

Swain, Biswa Ranjan; Dorrer, Christophe; Qiao, Jie

High-performance optical differentiation wavefront sensing towards freeform metrology Journal Article

In: Opt. Express, 27 (25), pp. 36297-36310, 2019.

Abstract | BibTeX | Tags: CeFO related, metrology

Shearing interferometry via geometric phase

BRUNO PICCIRILLO LUIS A. ALEMÁN-CASTANEDA, ENRICO SANTAMATO; ALONSO, MIGUEL A.

Shearing interferometry via geometric phase Journal Article

In: Optica, 6 (4), pp. 396-399, 2019.

Abstract | Links | BibTeX | Tags: metrology, related

2018

Point-cloud noncontact metrology of freeform optical surfaces

Yao, Jianing; Anderson, Alexander; Rolland, Jannick P.

Point-cloud noncontact metrology of freeform optical surfaces Journal Article

In: Optics Express, 26 (8), pp. 10242-10265, 2018.

Abstract | Links | BibTeX | Tags: metrology, related

Experimental investigation in nodal aberration theory (NAT) with a customized Ritchey-Chrétien system: third-order coma

Zhao, Nan; Papa, Jonathan C.; Fuerschbach, Kyle; Qiao, Yanfeng; Thompson, Kevin P.; Rolland, Jannick P.

Experimental investigation in nodal aberration theory (NAT) with a customized Ritchey-Chrétien system: third-order coma Journal Article

In: Optics Express, 26 (7), pp. 8729-8743, 2018.

Abstract | Links | BibTeX | Tags: metrology, related

2017

Twyman effects in thin curved optics

Lambropoulos, John C.

Twyman effects in thin curved optics Proceeding

SPIE, SPIE Vol 10448 (104480V (2017)), 2017.

Abstract | Links | BibTeX | Tags: CeFO related, metrology

2014

Freeform Optics Metrology Using Optical Coherence Tomography

Yao, Jianing; Rolland, Jannick P.

Freeform Optics Metrology Using Optical Coherence Tomography Conference

Optical Fabrication and Testing, OSA 2014.

BibTeX | Tags: metrology, related