CeFO-Related Publications

@article{nokey,

title = {Metaform optics: Bridging nanophotonics and freeform optics},

author = {Daniel K. Nikolov and Aaron Bauer and Fei Cheng and Hitoshi Kato and A. Nick Vamivakas and Jannick P. Rolland},

url = {https://www.science.org/doi/abs/10.1126/sciadv.abe5112},

doi = {10.1126/sciadv.abe5112},

year  = {2021},

date = {2021-04-30},

urldate = {2021-04-30},

journal = {Science Advances},

volume = {7},

number = {18},

pages = {eabe5112},

abstract = {The demand for high-resolution optical systems with a compact form factor, such as augmented reality displays, sensors, and mobile cameras, requires creating new optical component architectures. Advances in the design and fabrication of freeform optics and metasurfaces make them potential solutions to address the previous needs. Here, we introduce the concept of a metaform—an optical surface that integrates the combined benefits of a freeform optic and a metasurface into a single optical component. We experimentally realized a miniature imager using a metaform mirror. The mirror is fabricated via an enhanced electron beam lithography process on a freeform substrate. The design degrees of freedom enabled by a metaform will support a new generation of optical systems.},

keywords = {Aberration correction, augmented reality, CeFO manufacturing, CEFO metrology, freeform, head display, Image quality, Optical design, relay optics, rolland, tomography},

pubstate = {published},

tppubtype = {article}

}

@article{DeMars_02,

title = {Single-Shot Phase Calibration of a Spatial Light Modulator using Geometric Phase Interferometry},

author = {L. A. DeMars and M. Mikula-Zdankowska and K. Falaggis and R. Porras-Aguilar},

doi = {https://doi.org/10.1364/AO.383610},

year  = {2020},

date = {2020-01-01},

urldate = {2020-01-01},

journal = {Appl. Opt.},

volume = {59},

issue = {13},

pages = {D125-D130},

abstract = {A vibration-insensitive, single-shot phase-calibration method for phase-only spatial light modulators (SLM) is reported. The proposed technique uses a geometric phase lens to form a phase-shifting radial shearing interferometer to enable common-path measurements. This configuration has several advantages: (a) unlike diffraction-based SLM calibration techniques, this technique is robust against intensity errors due to misalignment; (b) unlike two-beam interferometers, this technique offers a high environmental stability; and (c) unlike intensity-based methods, the phase-shifting capability provides a phase uncertainty routinely in the order of 2𝜋/100

. The experimental results show a significantly higher accuracy when compared to the diffraction-based approaches.},

keywords = {CEFO metrology, CeFO related},

pubstate = {published},

tppubtype = {article}

}

@article{TAYLOR2019,

title = {Femtosecond laser polishing of germanium},

author = {LAUREN L. TAYLOR, JING XU, MICHAEL POMERANTZ, THOMAS

R. SMITH, JOHN C. LAMBROPOULOS, AND JIE QIAO},

url = {https://doi.org/10.1364/OME.9.004165},

year  = {2019},

date = {2019-10-02},

journal = {Optical Materials Express},

volume = {9},

number = {11},

pages = {4165-4177},

abstract = {Freeform optics can reduce the cost, weight, and size of advanced imaging systems,

but it is challenging to manufacture the complex rotationally asymmetric surfaces to optical

tolerances. To address the need for disruptive, high-precision sub-aperture forming and finishing

techniques for freeform optics, we investigate an alternative, non-contact polishing methodology

using femtosecond lasers, combining modeling, experiments, and demonstrations. Femtosecondlaser-

based polishing of germanium was investigated using an experimentally-validated twotemperature

model of laser/germanium interaction to guide the understanding and selection of

laser parameters to achieve near-nonthermal ablation for polishing and figuring. For the first time

to our knowledge, model-guided femtosecond laser polishing of germanium was successfully

demonstrated, achieving precision material removal while maintaining single-digit nanometer

optical surface quality. The demonstrated femtosecond-laser-based polishing technique lays the

foundation for semiconductor optics polishing/fabrication using femtosecond lasers and opens a

viable path for high-precision, complex sub-aperture optical polishing tasks on various materials.},

keywords = {CeFO manufacturing, CEFO metrology, fabrication, Freeform surfaces, manufacturing, Mid-Spatial Frequency error},

pubstate = {published},

tppubtype = {article}

}

@article{DeMars_01,

title = {Calibration of an SLM using Geometric Phase Interferometry},

author = {L. A. DeMars and K. Falaggis and R. Porras-Aguilar },

year  = {2019},

date = {2019-06-01},

journal = {RIAO-OPTILAS-MOPM},

keywords = {CEFO metrology, CeFO related},

pubstate = {published},

tppubtype = {article}

}