2015
Giannechini, L.
Design and Quantification of Highly Corrosion-Resistant Magnetorheological Finishing Powder Masters Thesis
University of Rochester, Department of Mechanical Engineering, 2015.
Abstract | Links | BibTeX | Tags: manufacturing, related
@mastersthesis{Giannechini2015,
title = {Design and Quantification of Highly Corrosion-Resistant Magnetorheological Finishing Powder},
author = {Giannechini, L.},
url = {https://www.lle.rochester.edu/media/publications/documents/theses/Giannechini.pdf},
year = {2015},
date = {2015-11-10},
urldate = {2015-11-10},
address = {Department of Mechanical Engineering},
school = {University of Rochester},
abstract = {The purpose of this work is to increase the corrosion resistance of micron-sized zirconia
coated iron powders, and to develop a reliable and precise method of quantifying a
variety of the material's parameters. The powders that were tested are used as the base
of the magnetorheological nishing slurries in the Magnetorehological Finishing (MRF)
lab at the Laboratory for Laser Energetics. Development of the following methods
enables quantitative comparisons between various batches of MRF powder, and serves
as a metric for variations in performance. In this work, methods for the quanti cation of:
corrosion time, mass fraction of the elements in the bulk powder, powder density, particle
size distribution, concentration of free zirconia, and coating thickness were developed.
This research was performed as a result of recent MRF work combining the e ects of
acid etching and mechanical removal of material into a single process, which made it
necessary to both increase the corrosion resistance of the material, as well as to de ning
di erences between the two iterations of the product. Several techniques were used
to obtain the data necessary for analysis of the powders. A full factorial experiment
was employed to determine what factors to alter in the powder production. Techniques
including XRD, XPS, EDS, and XRF were all utilized in determining the relative mass
fraction of the components present in the powder. Gas pycnometry and colloidal analysis
were used to determine densities and particle size distributions. Magnetic separation
and centrifugation were used to isolate and condense the nonmagnetic free zirconia
present in the samples. Scanning electron microscopy (SEM) micrographs of particle
cross sections enabled analysis of coating thicknesses. Increasing the concentration of
zirconia during the coating procedure resulted in a positive correlation with improved
corrosion resistance. Of the methods used to analyze mass fraction, XRF proved to
be the fastest and most reliable. If further improvements in corrosion resistance are
required, it is recommended to increase the thickness of the zirconia coating, or develop
a dual coating of an acid resistant polymer and zirconia (although this may have adverse
e ects on the powder's magnetic potential).},
type = {related},
keywords = {manufacturing, related},
pubstate = {published},
tppubtype = {mastersthesis}
}
The purpose of this work is to increase the corrosion resistance of micron-sized zirconia
coated iron powders, and to develop a reliable and precise method of quantifying a
variety of the material's parameters. The powders that were tested are used as the base
of the magnetorheological nishing slurries in the Magnetorehological Finishing (MRF)
lab at the Laboratory for Laser Energetics. Development of the following methods
enables quantitative comparisons between various batches of MRF powder, and serves
as a metric for variations in performance. In this work, methods for the quanti cation of:
corrosion time, mass fraction of the elements in the bulk powder, powder density, particle
size distribution, concentration of free zirconia, and coating thickness were developed.
This research was performed as a result of recent MRF work combining the e ects of
acid etching and mechanical removal of material into a single process, which made it
necessary to both increase the corrosion resistance of the material, as well as to de ning
di erences between the two iterations of the product. Several techniques were used
to obtain the data necessary for analysis of the powders. A full factorial experiment
was employed to determine what factors to alter in the powder production. Techniques
including XRD, XPS, EDS, and XRF were all utilized in determining the relative mass
fraction of the components present in the powder. Gas pycnometry and colloidal analysis
were used to determine densities and particle size distributions. Magnetic separation
and centrifugation were used to isolate and condense the nonmagnetic free zirconia
present in the samples. Scanning electron microscopy (SEM) micrographs of particle
cross sections enabled analysis of coating thicknesses. Increasing the concentration of
zirconia during the coating procedure resulted in a positive correlation with improved
corrosion resistance. Of the methods used to analyze mass fraction, XRF proved to
be the fastest and most reliable. If further improvements in corrosion resistance are
required, it is recommended to increase the thickness of the zirconia coating, or develop
a dual coating of an acid resistant polymer and zirconia (although this may have adverse
e ects on the powder's magnetic potential).
coated iron powders, and to develop a reliable and precise method of quantifying a
variety of the material's parameters. The powders that were tested are used as the base
of the magnetorheological nishing slurries in the Magnetorehological Finishing (MRF)
lab at the Laboratory for Laser Energetics. Development of the following methods
enables quantitative comparisons between various batches of MRF powder, and serves
as a metric for variations in performance. In this work, methods for the quanti cation of:
corrosion time, mass fraction of the elements in the bulk powder, powder density, particle
size distribution, concentration of free zirconia, and coating thickness were developed.
This research was performed as a result of recent MRF work combining the e ects of
acid etching and mechanical removal of material into a single process, which made it
necessary to both increase the corrosion resistance of the material, as well as to de ning
di erences between the two iterations of the product. Several techniques were used
to obtain the data necessary for analysis of the powders. A full factorial experiment
was employed to determine what factors to alter in the powder production. Techniques
including XRD, XPS, EDS, and XRF were all utilized in determining the relative mass
fraction of the components present in the powder. Gas pycnometry and colloidal analysis
were used to determine densities and particle size distributions. Magnetic separation
and centrifugation were used to isolate and condense the nonmagnetic free zirconia
present in the samples. Scanning electron microscopy (SEM) micrographs of particle
cross sections enabled analysis of coating thicknesses. Increasing the concentration of
zirconia during the coating procedure resulted in a positive correlation with improved
corrosion resistance. Of the methods used to analyze mass fraction, XRF proved to
be the fastest and most reliable. If further improvements in corrosion resistance are
required, it is recommended to increase the thickness of the zirconia coating, or develop
a dual coating of an acid resistant polymer and zirconia (although this may have adverse
e ects on the powder's magnetic potential).
Yao, J.; Huang, J.; Meemon, P.; Ponting, M.; Rolland, J. P.
In: Opt. Express, vol. 23, no. 23, pp. 30149-30164, 2015.
Abstract | Links | BibTeX | Tags: related, testing
@article{YAO15b,
title = {Simultaneous estimation of thickness and refractive index of layered gradient refractive index optics using a hybrid confocal-scan swept-source optical coherence tomography system},
author = {Yao, J. and J. Huang and P. Meemon and M. Ponting and J. P. Rolland},
doi = {https://doi.org/10.1364/OE.23.030149},
year = {2015},
date = {2015-11-10},
urldate = {2015-11-10},
journal = {Opt. Express},
volume = {23},
number = {23},
pages = {30149-30164},
abstract = {A hybrid confocal-scan swept-source optical coherence tomography metrology system was conceived for simultaneous measurements of the refractive index and thickness profiles of polymeric layered gradient refractive index (GRIN) optics. An uncertainty analysis predicts the metrology capability of the system and guides the selection of an optimum working numerical aperture. Experimental results on both a monolithic and a GRIN layered sheet are demonstrated to be in close agreement with theoretical predictions. Index measurement precision reached 0.0001 and 0.0008 for measuring 2.8 mm and ~300 µm thick layers, respectively. The thicknesses of these layers were simultaneously measured with a precision of 0.28 and 0.17 µm, respectively.},
keywords = {related, testing},
pubstate = {published},
tppubtype = {article}
}
A hybrid confocal-scan swept-source optical coherence tomography metrology system was conceived for simultaneous measurements of the refractive index and thickness profiles of polymeric layered gradient refractive index (GRIN) optics. An uncertainty analysis predicts the metrology capability of the system and guides the selection of an optimum working numerical aperture. Experimental results on both a monolithic and a GRIN layered sheet are demonstrated to be in close agreement with theoretical predictions. Index measurement precision reached 0.0001 and 0.0008 for measuring 2.8 mm and ~300 µm thick layers, respectively. The thicknesses of these layers were simultaneously measured with a precision of 0.28 and 0.17 µm, respectively.
Gray, R.
2015.
Abstract | Links | BibTeX | Tags: design, related
@phdthesis{GRAY-THESIS,
title = {Investigation of the Field Dependence of the Aberration Functions of Rotationally Nonsymmetric Optical Imaging Systems},
author = {Gray, R.},
url = {https://urresearch.rochester.edu/institutionalPublicationPublicView.action?institutionalItemId=29981&versionNumber=1},
year = {2015},
date = {2015-11-06},
urldate = {2015-11-06},
abstract = {It is shown how Shack’s vector product (SVP) can be used to express the expansion of the monochromatic wavefront aberration function for rotationally symmetric optical imaging models using the H. H. Hopkins’ expansion coefficients. As a result of this research it was discovered that SVP fits naturally within the framework of 2-dimensional Geometric Algebra (GA). It is further shown how SVP can be used to define two-dimensional vectors in terms of the Zernike polynomials. The wavefront aberration function expansion is then expressed in terms of these Zernike vectors. A method for calculating the H. H. Hopkins’ expansion coefficients is described, including the calculation of the per surface, sphere/asphere, intrinsic/extrinsic expansion coefficient contributions. Methods for converting the Zernike expansion coefficients into the H. H. Hopkins’ expansion coefficients have been developed and are presented in this work. Nodal aberration theory (NAT), now well established in the literature, is presented in terms of these mathematical developments. As a quantitative validation of the NAT predications of an optical system’s field dependence, comparisons are made between the full field displays (FFDs) produced by using a double Zernike expansion of the wavefront aberration function and by application of NAT to rotationally symmetric optical imaging systems having one or more surfaces decentered and/or tilted. Validation of these developments is provided using idealized computer models of several space telescopes having one or more optical surfaces decentered and/or tilted. Initial steps toward one approach for extending NAT to include optical imaging systems containing freeform surface shapes defined by Zernike polynomials is also provided.},
keywords = {design, related},
pubstate = {published},
tppubtype = {phdthesis}
}
It is shown how Shack’s vector product (SVP) can be used to express the expansion of the monochromatic wavefront aberration function for rotationally symmetric optical imaging models using the H. H. Hopkins’ expansion coefficients. As a result of this research it was discovered that SVP fits naturally within the framework of 2-dimensional Geometric Algebra (GA). It is further shown how SVP can be used to define two-dimensional vectors in terms of the Zernike polynomials. The wavefront aberration function expansion is then expressed in terms of these Zernike vectors. A method for calculating the H. H. Hopkins’ expansion coefficients is described, including the calculation of the per surface, sphere/asphere, intrinsic/extrinsic expansion coefficient contributions. Methods for converting the Zernike expansion coefficients into the H. H. Hopkins’ expansion coefficients have been developed and are presented in this work. Nodal aberration theory (NAT), now well established in the literature, is presented in terms of these mathematical developments. As a quantitative validation of the NAT predications of an optical system’s field dependence, comparisons are made between the full field displays (FFDs) produced by using a double Zernike expansion of the wavefront aberration function and by application of NAT to rotationally symmetric optical imaging systems having one or more surfaces decentered and/or tilted. Validation of these developments is provided using idealized computer models of several space telescopes having one or more optical surfaces decentered and/or tilted. Initial steps toward one approach for extending NAT to include optical imaging systems containing freeform surface shapes defined by Zernike polynomials is also provided.
Salzman, S.; Romanofsky, H. J.; Giannechini, L. J.; Jacobs, S. D.; Lambropoulos, J. C.
Magnetorheological finishing of chemical-vapor-deposited zinc sulfide via chemically and mechanically modified fluids Journal Article
In: Applied Optics, vol. 55, no. 6, pp. 1481, 2015.
Abstract | Links | BibTeX | Tags: manufacturing, related
@article{Salzman15,
title = {Magnetorheological finishing of chemical-vapor-deposited zinc sulfide via chemically and mechanically modified fluids},
author = {Salzman, S. and H. J. Romanofsky and L. J. Giannechini and S. D. Jacobs and J. C. Lambropoulos},
doi = {https://doi.org/10.1364/AO.55.001481},
year = {2015},
date = {2015-11-03},
urldate = {2015-11-03},
journal = {Applied Optics},
volume = {55},
number = {6},
pages = {1481},
abstract = {We describe the anisotropy in the material-removal rate (MRR) of the polycrystalline, chemical-vapor–deposited (CVD) zinc sulfide (ZnS). We define the polycrystalline anisotropy via microhardness and chemical erosion tests for four crystallographic orientations of ZnS: (100), (110), (111), and (311). Anisotropy in the MRR was studied under magnetorheological finishing (MRF) conditions. Three chemically and mechanically modified magnetorheological (MR) fluids at pH values of 4, 5, and 6 were used to test the MRR variations among the four single-crystal planes. When polishing the single-crystal planes and the polycrystalline with pH 5 and pH 6 MR fluids, variations were found in the MRR among the four single-crystal planes and surface artifacts were observed on the polycrystalline material. When polishing the single-crystal planes and the polycrystalline with the modified MR fluid at pH 4, however, minimal variation was observed in the MRR among the four orientations and a reduction in surface artifacts was achieved on the polycrystalline material.},
keywords = {manufacturing, related},
pubstate = {published},
tppubtype = {article}
}
We describe the anisotropy in the material-removal rate (MRR) of the polycrystalline, chemical-vapor–deposited (CVD) zinc sulfide (ZnS). We define the polycrystalline anisotropy via microhardness and chemical erosion tests for four crystallographic orientations of ZnS: (100), (110), (111), and (311). Anisotropy in the MRR was studied under magnetorheological finishing (MRF) conditions. Three chemically and mechanically modified magnetorheological (MR) fluids at pH values of 4, 5, and 6 were used to test the MRR variations among the four single-crystal planes. When polishing the single-crystal planes and the polycrystalline with pH 5 and pH 6 MR fluids, variations were found in the MRR among the four single-crystal planes and surface artifacts were observed on the polycrystalline material. When polishing the single-crystal planes and the polycrystalline with the modified MR fluid at pH 4, however, minimal variation was observed in the MRR among the four orientations and a reduction in surface artifacts was achieved on the polycrystalline material.
Moore, D. B.; Fienup, J. R.
Sub-Aperture Position Estimation in Transverse-Translation Diversity Wavefront Sensing Conference
2015.
Abstract | Links | BibTeX | Tags: related, testing
@conference{Moore_AOMS_2015,
title = {Sub-Aperture Position Estimation in Transverse-Translation Diversity Wavefront Sensing},
author = {D. B. Moore and J.R. Fienup},
doi = {10.1364/AOMS.2015.AOM3F.4},
year = {2015},
date = {2015-10-21},
journal = {Imaging and Applied Optics 2015 OSA Technical Digest (online) (Optical Society of America, 2015)},
pages = {AOM3F.4},
abstract = {Image-based wavefront sensing involving a sub-aperture translating in an unknown fashion in a pupil plane is demonstrated experimentally in the case that the target is also translating in an unknown fashion.},
keywords = {related, testing},
pubstate = {published},
tppubtype = {conference}
}
Image-based wavefront sensing involving a sub-aperture translating in an unknown fashion in a pupil plane is demonstrated experimentally in the case that the target is also translating in an unknown fashion.
Yao, Jianing; Xu, Di; Zhao, Nan; Rolland, Jannick P.
Proceedings of SPIE, vol. 9633, no. 96331A, 2015.
Abstract | Links | BibTeX | Tags: related, testing
@conference{Yao15optifab,
title = {Freeform metrology using swept-source optical coherence tomography with custom pupil-relay precision scanning configuration},
author = {Jianing Yao and Di Xu and Nan Zhao and Jannick P. Rolland},
doi = {https://doi.org/10.1117/12.2195939},
year = {2015},
date = {2015-10-11},
urldate = {2015-10-11},
booktitle = {Proceedings of SPIE},
volume = {9633},
number = {96331A},
abstract = {The recent advances in the optics manufacturing industry to achieve the capability of fabricating rotationally nonsymmetric optical quality surfaces have considerably stimulated the optical designs with freeform components. This opens up new horizons for novel optical systems with larger fields of view and higher performance, or significantly more compact in volume at equal performance compared to conventional systems. A bottleneck to the broad industrial applications of freeform optics remains the lack of a high performance optical metrology tool capable of measuring significant surface departures and slopes of the parts. To address this issue, we have developed a fiber-based swept-source optical coherence tomography (SS-OCT) system for point-cloud freeform metrology, where two-axis galvanometer scanners are leveraged for high-speed lateral scans. We specifically designed a custom all-reflective achromatic pupil relay system to achieve a diffraction-limited scanning configuration. Coupled with a large field-of-view (FOV) telecentric scan lens, the imaging covers 28.9 mm × 28.9 mm FOV with 35 μm lateral resolution and more than 600 μm depth of focus. Freeform metrology is demonstrated for an Alvarez surface of 400 μm surface sag. The high sensitivity of the SS-OCT system allows for capturing the slope variations of the part up to the maximum slope that is 5 degrees in this case. Specific surface reconstruction, rendering and fitting algorithms were developed to evaluate the metrology results and investigate the accuracy and precision of the measurements.},
keywords = {related, testing},
pubstate = {published},
tppubtype = {conference}
}
The recent advances in the optics manufacturing industry to achieve the capability of fabricating rotationally nonsymmetric optical quality surfaces have considerably stimulated the optical designs with freeform components. This opens up new horizons for novel optical systems with larger fields of view and higher performance, or significantly more compact in volume at equal performance compared to conventional systems. A bottleneck to the broad industrial applications of freeform optics remains the lack of a high performance optical metrology tool capable of measuring significant surface departures and slopes of the parts. To address this issue, we have developed a fiber-based swept-source optical coherence tomography (SS-OCT) system for point-cloud freeform metrology, where two-axis galvanometer scanners are leveraged for high-speed lateral scans. We specifically designed a custom all-reflective achromatic pupil relay system to achieve a diffraction-limited scanning configuration. Coupled with a large field-of-view (FOV) telecentric scan lens, the imaging covers 28.9 mm × 28.9 mm FOV with 35 μm lateral resolution and more than 600 μm depth of focus. Freeform metrology is demonstrated for an Alvarez surface of 400 μm surface sag. The high sensitivity of the SS-OCT system allows for capturing the slope variations of the part up to the maximum slope that is 5 degrees in this case. Specific surface reconstruction, rendering and fitting algorithms were developed to evaluate the metrology results and investigate the accuracy and precision of the measurements.
Huang, J.; Yao, J.; Cirucci, N. M.; Ivanov, T.; Rolland, J. P.
Thickness estimation with optical coherence tomography and statistical decision theory Conference
proceeding of SPIE, vol. 9633, no. 96330P, 2015.
Abstract | Links | BibTeX | Tags: related, testing
@conference{Huangoptifab15,
title = {Thickness estimation with optical coherence tomography and statistical decision theory},
author = {Huang, J. and J. Yao and N.M. Cirucci and T. Ivanov and J.P. Rolland},
doi = {https://doi.org/10.1117/12.2195969},
year = {2015},
date = {2015-10-11},
urldate = {2015-10-11},
booktitle = {proceeding of SPIE},
volume = {9633},
number = {96330P},
abstract = {Thickness estimation, which has a broad range of applications, plays an important role in the field of optical metrology. In this study, we investigate a new approach—combining optical coherence tomography (OCT) and statistical decision theory—for thickness estimation. We first discussed and quantified the intensity noise of three commonly used broadband sources, a super-continuum source, a super-luminescent diode (SLD), and a swept source. Furthermore, a maximum-likelihood (ML) estimator was implemented to interpret the OCT raw data. Based on the mathematical model and the ML estimator, simulations were set up to investigate the impact of different broadband sources in OCT for a thickness estimation task. We then validated the theoretical framework with physical phantoms. Results demonstrate unbiased nanometer-class thickness estimates with the ML estimator. The framework can be potentially used for film and surface shape metrology.},
keywords = {related, testing},
pubstate = {published},
tppubtype = {conference}
}
Thickness estimation, which has a broad range of applications, plays an important role in the field of optical metrology. In this study, we investigate a new approach—combining optical coherence tomography (OCT) and statistical decision theory—for thickness estimation. We first discussed and quantified the intensity noise of three commonly used broadband sources, a super-continuum source, a super-luminescent diode (SLD), and a swept source. Furthermore, a maximum-likelihood (ML) estimator was implemented to interpret the OCT raw data. Based on the mathematical model and the ML estimator, simulations were set up to investigate the impact of different broadband sources in OCT for a thickness estimation task. We then validated the theoretical framework with physical phantoms. Results demonstrate unbiased nanometer-class thickness estimates with the ML estimator. The framework can be potentially used for film and surface shape metrology.
Canavesi, C.; Cogliati, A.; Hayes, A.; Santhanam, A. P.; Tankam, P.; Rolland, J. P.
Proceedings of the SPIE, vol. 9633, no. 96330O, 2015.
Abstract | Links | BibTeX | Tags: related, testing
@conference{Canavesioptifab15,
title = {Gabor-domain optical coherence microscopy with integrated dual-axis MEMS scanner for fast 3D imaging and metrology},
author = {Canavesi, C. and A. Cogliati and A. Hayes and A.P. Santhanam and P. Tankam and J.P. Rolland},
doi = {https://doi.org/10.1117/12.2195828},
year = {2015},
date = {2015-10-11},
urldate = {2015-10-11},
booktitle = {Proceedings of the SPIE},
volume = {9633},
number = {96330O},
abstract = {Fast, robust, nondestructive 3D imaging is needed for characterization of microscopic structures in industrial and clinical applications. A custom micro-electromechanical system (MEMS)-based 2D scanner system was developed to achieve 55 kHz A-scan acquisition in a Gabor-domain optical coherence microscopy (GD-OCM) instrument with a novel multilevel GPU architecture for high-speed imaging. GD-OCM yields high-definition volumetric imaging with dynamic depth of focusing through a bio-inspired liquid lens-based microscope design, which has no moving parts and is suitable for use in a manufacturing setting or in a medical environment. A dual-axis MEMS mirror was chosen to replace two single-axis galvanometer mirrors; as a result, the astigmatism caused by the mismatch between the optical pupil and the scanning location was eliminated and a 12x reduction in volume of the scanning system was achieved. Imaging at an invariant resolution of 2 μm was demonstrated throughout a volume of 1 × 1 × 0.6 mm3, acquired in less than 2 minutes. The MEMS-based scanner resulted in improved image quality, increased robustness and lighter weight of the system – all factors that are critical for on-field deployment. A custom integrated feedback system consisting of a laser diode and a position-sensing detector was developed to investigate the impact of the resonant frequency of the MEMS and the driving signal of the scanner on the movement of the mirror. Results on the metrology of manufactured materials and characterization of tissue samples with GD-OCM are presented.},
keywords = {related, testing},
pubstate = {published},
tppubtype = {conference}
}
Fast, robust, nondestructive 3D imaging is needed for characterization of microscopic structures in industrial and clinical applications. A custom micro-electromechanical system (MEMS)-based 2D scanner system was developed to achieve 55 kHz A-scan acquisition in a Gabor-domain optical coherence microscopy (GD-OCM) instrument with a novel multilevel GPU architecture for high-speed imaging. GD-OCM yields high-definition volumetric imaging with dynamic depth of focusing through a bio-inspired liquid lens-based microscope design, which has no moving parts and is suitable for use in a manufacturing setting or in a medical environment. A dual-axis MEMS mirror was chosen to replace two single-axis galvanometer mirrors; as a result, the astigmatism caused by the mismatch between the optical pupil and the scanning location was eliminated and a 12x reduction in volume of the scanning system was achieved. Imaging at an invariant resolution of 2 μm was demonstrated throughout a volume of 1 × 1 × 0.6 mm3, acquired in less than 2 minutes. The MEMS-based scanner resulted in improved image quality, increased robustness and lighter weight of the system – all factors that are critical for on-field deployment. A custom integrated feedback system consisting of a laser diode and a position-sensing detector was developed to investigate the impact of the resonant frequency of the MEMS and the driving signal of the scanner on the movement of the mirror. Results on the metrology of manufactured materials and characterization of tissue samples with GD-OCM are presented.
Gray, R.; Rolland, J. P.
Wavefront aberration function in terms of R.V. Shack’s vector product and Zernike polynomial vectors Journal Article
In: JOSA A, vol. 32, no. 10, pp. 1836-1847, 2015.
Abstract | Links | BibTeX | Tags: design, related
@article{GRAY15,
title = {Wavefront aberration function in terms of R.V. Shack’s vector product and Zernike polynomial vectors},
author = {Gray, R. and J. P. Rolland},
doi = {https://doi.org/10.1364/JOSAA.32.001836},
year = {2015},
date = {2015-08-18},
urldate = {2015-08-18},
journal = {JOSA A},
volume = {32},
number = {10},
pages = {1836-1847},
abstract = {Previous papers have shown how, for rotationally symmetric optical imaging systems, nodes in the field dependence of the wavefront aberration function develop when a rotationally symmetric optical surface within an imaging optical system is decentered and/or tilted. In this paper, we show how Shack’s vector product (SVP) can be used to express the wavefront aberration function and to define vectors in terms of the Zernike polynomials. The wavefront aberration function is then expressed in terms of the Zernike vectors. It is further shown that SVP fits within the framework of two-dimensional geometric algebra (GA). Within the GA framework, an equation for the third-order node locations for the binodal astigmatism term that emerge in the presence of tilts and decenters is then demonstrated. A computer model of a three-mirror telescope system is used to demonstrate the validity of the mathematical development.},
keywords = {design, related},
pubstate = {published},
tppubtype = {article}
}
Previous papers have shown how, for rotationally symmetric optical imaging systems, nodes in the field dependence of the wavefront aberration function develop when a rotationally symmetric optical surface within an imaging optical system is decentered and/or tilted. In this paper, we show how Shack’s vector product (SVP) can be used to express the wavefront aberration function and to define vectors in terms of the Zernike polynomials. The wavefront aberration function is then expressed in terms of the Zernike vectors. It is further shown that SVP fits within the framework of two-dimensional geometric algebra (GA). Within the GA framework, an equation for the third-order node locations for the binodal astigmatism term that emerge in the presence of tilts and decenters is then demonstrated. A computer model of a three-mirror telescope system is used to demonstrate the validity of the mathematical development.
Duma, V.; Tankam, P.; Huang, J.; Won, J.; J. P. Rolland,
Optimization of galvanometer scanning for optical coherence tomography Journal Article
In: Applied Optics, vol. 54, no. 17, pp. 5495-5507, 2015.
Abstract | Links | BibTeX | Tags: related, testing
@article{DUMA15,
title = {Optimization of galvanometer scanning for optical coherence tomography},
author = {Duma, V. and P. Tankam and J. Huang and J. Won and J. P. Rolland,},
doi = {https://doi.org/10.1364/AO.54.005495},
year = {2015},
date = {2015-06-10},
urldate = {2015-06-10},
journal = {Applied Optics},
volume = {54},
number = {17},
pages = {5495-5507},
abstract = {We study experimentally the effective duty cycle of galvanometer-based scanners (GSs) with regard to three main parameters of the scanning process: theoretical/imposed duty cycle (of the input signal), scan frequency, and scan amplitude. Sawtooth and triangular input signals for the device are considered. The effects of the mechanical inertia of the oscillatory element of the GS are analyzed and their consequences are discussed in the context of optical coherence tomography (OCT) imaging. When the theoretical duty cycle and the scan amplitude are increased to the limit, the saturation of the device is demonstrated for a useful range of scan frequencies by direct measurement of the position of the galvomirror. Investigations of OCT imaging of large samples also validate this saturation, as examplified by the gaps/blurred portions obtained between neighboring images when using both triangular and sawtooth scanning at high scan frequencies. For this latter aspect, the necessary overlap between neighboring B-scans, and therefore between the corresponding volumetric reconstructions of the sample, are evaluated and implemented with regard to the same parameters of the scanning process. OCT images that are free of these artifacts are thus obtained.},
keywords = {related, testing},
pubstate = {published},
tppubtype = {article}
}
We study experimentally the effective duty cycle of galvanometer-based scanners (GSs) with regard to three main parameters of the scanning process: theoretical/imposed duty cycle (of the input signal), scan frequency, and scan amplitude. Sawtooth and triangular input signals for the device are considered. The effects of the mechanical inertia of the oscillatory element of the GS are analyzed and their consequences are discussed in the context of optical coherence tomography (OCT) imaging. When the theoretical duty cycle and the scan amplitude are increased to the limit, the saturation of the device is demonstrated for a useful range of scan frequencies by direct measurement of the position of the galvomirror. Investigations of OCT imaging of large samples also validate this saturation, as examplified by the gaps/blurred portions obtained between neighboring images when using both triangular and sawtooth scanning at high scan frequencies. For this latter aspect, the necessary overlap between neighboring B-scans, and therefore between the corresponding volumetric reconstructions of the sample, are evaluated and implemented with regard to the same parameters of the scanning process. OCT images that are free of these artifacts are thus obtained.
Yao, J.; Meemon, P.; Ponting, M.; Rolland, J. P.
Metrology of 3D freeform spherical gradient index preforms Conference
Imaging and Applied Optics 2015OSA Technical Digest, no. FT3B.3 , 2015, (Imaging and Applied Optics 2015, OSA Technical Digest, paper FT3B.3 (2015). ).
Abstract | Links | BibTeX | Tags: related, testing
@conference{Yao15pa,
title = {Metrology of 3D freeform spherical gradient index preforms},
author = {Yao, J. and P. Meemon and M. Ponting and J. P. Rolland},
doi = {https://doi.org/10.1364/FREEFORM.2015.FT3B.3},
year = {2015},
date = {2015-06-08},
urldate = {2015-06-08},
booktitle = {Imaging and Applied Optics 2015OSA Technical Digest},
number = {FT3B.3 },
abstract = {We present an angular-scan swept-source optical coherence tomography system for 3D imaging and concentricity characterization of two generations of spherical gradient index preforms with a method to decouple the physical thickness and the index measurements.},
note = {Imaging and Applied Optics 2015, OSA Technical Digest, paper FT3B.3 (2015). },
keywords = {related, testing},
pubstate = {published},
tppubtype = {conference}
}
We present an angular-scan swept-source optical coherence tomography system for 3D imaging and concentricity characterization of two generations of spherical gradient index preforms with a method to decouple the physical thickness and the index measurements.
Evans, C. J.; Browy, E. C.; Childs, T. H. C.; Paul, E.
Interferometric measurements of single crystal diamond tool wear Journal Article
In: CIRP Annals - Manufacturing Technology, vol. 64, pp. 125-128, 2015.
Abstract | Links | BibTeX | Tags: related, testing
@article{Evans15,
title = {Interferometric measurements of single crystal diamond tool wear},
author = {Evans, C. J. and E.C. Browy and T.H.C. Childs and E. Paul },
doi = {https://doi.org/10.1016/j.cirp.2015.04.066},
year = {2015},
date = {2015-05-04},
urldate = {2015-05-04},
journal = {CIRP Annals - Manufacturing Technology},
volume = {64},
pages = {125-128},
abstract = {Interferometric measurements of plunge cuts made in a reference component intermittently during cutting tool wear tests allow measurement of the detail of tool edge recession without removing the tool from the machine. Hence the evolution of the tool wear can be evaluated with a resolution of less than 5 nm. A plunge cut using the new tool is subtracted from subsequent measurements, providing a direct measure of wear and removing bias from the scanning white light interferometer that would arise from non-zero slopes in the field of view. The method is illustrated with results from single crystal diamond tool wear tests when machining a family of nickel-copper alloys of varying composition. The dominant wear mechanism depends on the alloy and the cutting parameters. Nose flattening, leading edge recession, chipping, and formation of Pekelharing grooves can all be identified.},
keywords = {related, testing},
pubstate = {published},
tppubtype = {article}
}
Interferometric measurements of plunge cuts made in a reference component intermittently during cutting tool wear tests allow measurement of the detail of tool edge recession without removing the tool from the machine. Hence the evolution of the tool wear can be evaluated with a resolution of less than 5 nm. A plunge cut using the new tool is subtracted from subsequent measurements, providing a direct measure of wear and removing bias from the scanning white light interferometer that would arise from non-zero slopes in the field of view. The method is illustrated with results from single crystal diamond tool wear tests when machining a family of nickel-copper alloys of varying composition. The dominant wear mechanism depends on the alloy and the cutting parameters. Nose flattening, leading edge recession, chipping, and formation of Pekelharing grooves can all be identified.
Huang, J.; Tankam, P.; Hindman, H. B.; Aquavella, J. V.; Clarkson, E.; Kupinski, M. A.; Rolland, J. P.
Tear film thickness estimation using optical coherence tomography and maximum-likelihood estimation Presentation
02.05.2015.
Abstract | Links | BibTeX | Tags: related, testing
@misc{Huangarvo,
title = {Tear film thickness estimation using optical coherence tomography and maximum-likelihood estimation},
author = {Huang, J. and P. Tankam and H. B. Hindman and J. V. Aquavella and E. Clarkson and M. A. Kupinski and J. P. Rolland},
doi = {10.1117/12.2083160},
year = {2015},
date = {2015-05-02},
urldate = {2015-05-02},
abstract = {In biophotonics imaging, one important and quantitative task is layer-thickness estimation. In this study, we investigate the approach of combining optical coherence tomography and a maximum-likelihood (ML) estimator for layer thickness estimation in the context of tear film imaging. The motivation of this study is to extend our understanding of tear film dynamics, which is the prerequisite to advance the management of Dry Eye Disease, through the simultaneous estimation of the thickness of the tear film lipid and aqueous layers. The estimator takes into account the different statistical processes associated with the imaging chain. We theoretically investigated the impact of key system parameters, such as the axial point spread functions (PSF) and various sources of noise on measurement uncertainty. Simulations show that an OCT system with a 1 μm axial PSF (FWHM) allows unbiased estimates down to nanometers with nanometer precision. In implementation, we built a customized Fourier domain OCT system that operates in the 600 to 1000 nm spectral window and achieves 0.93 micron axial PSF in corneal epithelium. We then validated the theoretical framework with physical phantoms made of custom optical coatings, with layer thicknesses from tens of nanometers to microns. Results demonstrate unbiased nanometer-class thickness estimates in three different physical phantoms.},
keywords = {related, testing},
pubstate = {published},
tppubtype = {presentation}
}
In biophotonics imaging, one important and quantitative task is layer-thickness estimation. In this study, we investigate the approach of combining optical coherence tomography and a maximum-likelihood (ML) estimator for layer thickness estimation in the context of tear film imaging. The motivation of this study is to extend our understanding of tear film dynamics, which is the prerequisite to advance the management of Dry Eye Disease, through the simultaneous estimation of the thickness of the tear film lipid and aqueous layers. The estimator takes into account the different statistical processes associated with the imaging chain. We theoretically investigated the impact of key system parameters, such as the axial point spread functions (PSF) and various sources of noise on measurement uncertainty. Simulations show that an OCT system with a 1 μm axial PSF (FWHM) allows unbiased estimates down to nanometers with nanometer precision. In implementation, we built a customized Fourier domain OCT system that operates in the 600 to 1000 nm spectral window and achieves 0.93 micron axial PSF in corneal epithelium. We then validated the theoretical framework with physical phantoms made of custom optical coatings, with layer thicknesses from tens of nanometers to microns. Results demonstrate unbiased nanometer-class thickness estimates in three different physical phantoms.
Leach, R.; Evans, C.; He, L.; Davies, A.; Duparre, A.; Henning, A.; Jones, C.; O'Connor, D.
Open Questions in Surface Topography Measurement: a roadmap Journal Article
In: Surface Topography: Metrology and Properties, vol. 3, no. 1, pp. 013001, 2015.
Abstract | Links | BibTeX | Tags: related, testing
@article{Leach15,
title = {Open Questions in Surface Topography Measurement: a roadmap},
author = {Leach, R. and C. Evans and L. He and A. Davies and A. Duparre and A. Henning and C. Jones and D. O'Connor},
doi = {10.1088/2051-672X/3/1/013001},
year = {2015},
date = {2015-03-31},
urldate = {2015-03-31},
journal = {Surface Topography: Metrology and Properties},
volume = {3},
number = {1},
pages = {013001},
abstract = {Control of surface topography has always been of vital importance for manufacturing and many other engineering and scientific disciplines. However, despite over one hundred years of quantitative surface topography measurement, there are still many open questions. At the top of the list of questions is 'Are we getting the right answer?' This begs the obvious question 'How would we know?' There are many other questions relating to applications, the appropriateness of a technique for a given scenario, or the relationship between a particular analysis and the function of the surface. In this first 'open questions' article we have gathered together some experts in surface topography measurement and asked them to address timely, unresolved questions about the subject. We hope that their responses will go some way to answer these questions, address areas where further research is required, and look at the future of the subject. The first section 'Spatial content characterization for precision surfaces' addresses the need to characterise the spatial content of precision surfaces. Whilst we have been manufacturing optics for centuries, there still isn't a consensus on how to specify the surface for manufacture. The most common three methods for spatial characterisation are reviewed and compared, and the need for further work on quantifying measurement uncertainties is highlighted. The article is focussed on optical surfaces, but the ideas are more pervasive. Different communities refer to 'figure, mid-spatial frequencies, and finish' and 'form, waviness, and roughness', but the mathematics are identical. The second section 'Light scattering methods' is focussed on light scattering techniques; an important topic with in-line metrology becoming essential in many manufacturing scenarios. The potential of scattering methods has long been recognized; in the 'smooth surface limit' functionally significant relationships can be derived from first principles for statistically stationary, random surfaces. For rougher surfaces, correlations can be found experimentally for specific manufacturing processes. Improvements in computational methods encourage us to revisit light scattering as a powerful and versatile tool to investigate surface and thin film topographies, potentially providing information on both topography and defects over large areas at high speed. Future scattering techniques will be applied for complex film systems and for sub-surface damage measurement, but more research is required to quantify and standardise such measurements. A fundamental limitation of all topography measurement systems is their finite spatial bandwidth, which limits the slopes that they can detect. The third section 'Optical measurements of surfaces containing high slope angles' discusses this limitation and potential methods to overcome it. In some cases, a rough surface can allow measurement of slopes outside the classical optics limit, but more research is needed to fully understand this process. The last section 'What are the challenges for high dynamic range surface measurement?' presents the challenge facing metrologists by the use of surfaces that need measurement systems with very high spatial and temporal bandwidths, for example, those found in roll-to-roll manufacturing. High resolution, large areas and fast measurement times are needed, and these needs are unlikely to be fulfilled by developing a single all-purpose instrument. A toolbox of techniques needs to be developed which can be applied for any specific manufacturing scenario. The functional significance of surface topography has been known for centuries. Mirrors are smooth. Sliding behaviour depends on roughness. We have been measuring surfaces for centuries, but we still face many challenges. New manufacturing paradigms suggest that we need to make rapid measurements online that relate to the functional performance of the surface. This first 'open questions' collection addresses a subset of the challenges facing the surface metrology community. There are many more challenges which we would like to address in future 'open questions' articles. We welcome your feedback and your suggestions.},
keywords = {related, testing},
pubstate = {published},
tppubtype = {article}
}
Control of surface topography has always been of vital importance for manufacturing and many other engineering and scientific disciplines. However, despite over one hundred years of quantitative surface topography measurement, there are still many open questions. At the top of the list of questions is 'Are we getting the right answer?' This begs the obvious question 'How would we know?' There are many other questions relating to applications, the appropriateness of a technique for a given scenario, or the relationship between a particular analysis and the function of the surface. In this first 'open questions' article we have gathered together some experts in surface topography measurement and asked them to address timely, unresolved questions about the subject. We hope that their responses will go some way to answer these questions, address areas where further research is required, and look at the future of the subject. The first section 'Spatial content characterization for precision surfaces' addresses the need to characterise the spatial content of precision surfaces. Whilst we have been manufacturing optics for centuries, there still isn't a consensus on how to specify the surface for manufacture. The most common three methods for spatial characterisation are reviewed and compared, and the need for further work on quantifying measurement uncertainties is highlighted. The article is focussed on optical surfaces, but the ideas are more pervasive. Different communities refer to 'figure, mid-spatial frequencies, and finish' and 'form, waviness, and roughness', but the mathematics are identical. The second section 'Light scattering methods' is focussed on light scattering techniques; an important topic with in-line metrology becoming essential in many manufacturing scenarios. The potential of scattering methods has long been recognized; in the 'smooth surface limit' functionally significant relationships can be derived from first principles for statistically stationary, random surfaces. For rougher surfaces, correlations can be found experimentally for specific manufacturing processes. Improvements in computational methods encourage us to revisit light scattering as a powerful and versatile tool to investigate surface and thin film topographies, potentially providing information on both topography and defects over large areas at high speed. Future scattering techniques will be applied for complex film systems and for sub-surface damage measurement, but more research is required to quantify and standardise such measurements. A fundamental limitation of all topography measurement systems is their finite spatial bandwidth, which limits the slopes that they can detect. The third section 'Optical measurements of surfaces containing high slope angles' discusses this limitation and potential methods to overcome it. In some cases, a rough surface can allow measurement of slopes outside the classical optics limit, but more research is needed to fully understand this process. The last section 'What are the challenges for high dynamic range surface measurement?' presents the challenge facing metrologists by the use of surfaces that need measurement systems with very high spatial and temporal bandwidths, for example, those found in roll-to-roll manufacturing. High resolution, large areas and fast measurement times are needed, and these needs are unlikely to be fulfilled by developing a single all-purpose instrument. A toolbox of techniques needs to be developed which can be applied for any specific manufacturing scenario. The functional significance of surface topography has been known for centuries. Mirrors are smooth. Sliding behaviour depends on roughness. We have been measuring surfaces for centuries, but we still face many challenges. New manufacturing paradigms suggest that we need to make rapid measurements online that relate to the functional performance of the surface. This first 'open questions' collection addresses a subset of the challenges facing the surface metrology community. There are many more challenges which we would like to address in future 'open questions' articles. We welcome your feedback and your suggestions.
Yao, J.; Meemon, P.; Ponting, M.; Rolland, J. P.
Angular scan optical coherence tomography imaging and metrology of spherical gradient refractive index preforms Journal Article
In: Opt. Express, vol. 23, no. 5, pp. 6428-6443, 2015.
Abstract | Links | BibTeX | Tags: related, testing
@article{YAO15a,
title = {Angular scan optical coherence tomography imaging and metrology of spherical gradient refractive index preforms},
author = {Yao, J. and P. Meemon and M. Ponting and J. P. Rolland},
doi = {https://doi.org/10.1364/OE.23.006428},
year = {2015},
date = {2015-03-05},
urldate = {2015-03-05},
journal = {Opt. Express},
volume = {23},
number = {5},
pages = {6428-6443},
abstract = {The fabrication of high-performance spherical gradient refractive index (S-GRIN) optics requires nondestructive metrology techniques to inspect the samples. We have developed an angular-scan, swept-source-based, Fourier-domain optical coherence tomography (OCT) system centered at 1318 nm with 5 mm imaging depth capable of 180° polar scan and 360° azimuthal scan to investigate polymeric S-GRIN preforms. We demonstrate a method that enables simultaneous mapping of the group optical thickness, physical thickness, the radially-averaged group refractive index, and the transmitted wavefront of the S-GRIN preforms. The angular scan OCT imaging and metrology enables direct visualization, molding uniformity characterization, and optical property evaluations of the preforms. The results on two generations of S-GRIN preforms are discussed that showcase the evolution of the manufacturing process in response to the OCT metrology feedback.},
keywords = {related, testing},
pubstate = {published},
tppubtype = {article}
}
The fabrication of high-performance spherical gradient refractive index (S-GRIN) optics requires nondestructive metrology techniques to inspect the samples. We have developed an angular-scan, swept-source-based, Fourier-domain optical coherence tomography (OCT) system centered at 1318 nm with 5 mm imaging depth capable of 180° polar scan and 360° azimuthal scan to investigate polymeric S-GRIN preforms. We demonstrate a method that enables simultaneous mapping of the group optical thickness, physical thickness, the radially-averaged group refractive index, and the transmitted wavefront of the S-GRIN preforms. The angular scan OCT imaging and metrology enables direct visualization, molding uniformity characterization, and optical property evaluations of the preforms. The results on two generations of S-GRIN preforms are discussed that showcase the evolution of the manufacturing process in response to the OCT metrology feedback.
2014
Thompson, K. P.; Rolland, J. P.
Cost-driven self-consistent fabrication and assembly tolerance classes Conference
Proceedings of the SPIE, vol. 9633, no. 96330U, 2014.
Abstract | Links | BibTeX | Tags: assembly, design, related
@conference{Thomsponoptifab15b,
title = {Cost-driven self-consistent fabrication and assembly tolerance classes},
author = {Thompson, K.P. and J.P. Rolland},
doi = {https://doi.org/10.1117/12.2195783},
year = {2014},
date = {2014-10-11},
urldate = {2014-10-11},
booktitle = {Proceedings of the SPIE},
volume = {9633},
number = {96330U},
abstract = {At the 1994 International Optics Design Conference, a paper was presented by the author that proposed that optics costs are often driven by the fabrication and assembly tolerances. In addition, that these tolerances fall into groups (classes) that for any given shop are set typically by the capital investment in measurement equipment that the shop has access to. The premise is then that it is essential that the optical system tolerances on fabrication, e.g. radii, element thickness, wedge, surface figure, and surface finish and on assembly e.g. component tilt and decenter and spacer thickness and wedge that are assigned by the optical designer be self-consistent with the capabilities of the shops that are solicited to provide a quotation.
In the 1994 paper, five classes of optical fabricators were identified; catalog, regular, select, premium, and ultimate (lithography). For each of these classes, representative minimum tolerances were published along with estimates of the cost increment. An important concept is that if any one tolerance falls into a tighter class, then the optical system must be built in a shop capitalized to provide that one minimum tolerance and as a result all the other tolerances can typically be moved to the tighter class with little cost impact. The primary cost impact then is driven by the class of shop dictated by the minimum tolerance. In this talk, a primary purpose is to revisit the tolerances associated with a given class of shop and update the numbers to reflect advances in the intervening two decades.},
keywords = {assembly, design, related},
pubstate = {published},
tppubtype = {conference}
}
At the 1994 International Optics Design Conference, a paper was presented by the author that proposed that optics costs are often driven by the fabrication and assembly tolerances. In addition, that these tolerances fall into groups (classes) that for any given shop are set typically by the capital investment in measurement equipment that the shop has access to. The premise is then that it is essential that the optical system tolerances on fabrication, e.g. radii, element thickness, wedge, surface figure, and surface finish and on assembly e.g. component tilt and decenter and spacer thickness and wedge that are assigned by the optical designer be self-consistent with the capabilities of the shops that are solicited to provide a quotation.
In the 1994 paper, five classes of optical fabricators were identified; catalog, regular, select, premium, and ultimate (lithography). For each of these classes, representative minimum tolerances were published along with estimates of the cost increment. An important concept is that if any one tolerance falls into a tighter class, then the optical system must be built in a shop capitalized to provide that one minimum tolerance and as a result all the other tolerances can typically be moved to the tighter class with little cost impact. The primary cost impact then is driven by the class of shop dictated by the minimum tolerance. In this talk, a primary purpose is to revisit the tolerances associated with a given class of shop and update the numbers to reflect advances in the intervening two decades.
In the 1994 paper, five classes of optical fabricators were identified; catalog, regular, select, premium, and ultimate (lithography). For each of these classes, representative minimum tolerances were published along with estimates of the cost increment. An important concept is that if any one tolerance falls into a tighter class, then the optical system must be built in a shop capitalized to provide that one minimum tolerance and as a result all the other tolerances can typically be moved to the tighter class with little cost impact. The primary cost impact then is driven by the class of shop dictated by the minimum tolerance. In this talk, a primary purpose is to revisit the tolerances associated with a given class of shop and update the numbers to reflect advances in the intervening two decades.
Yao, Jianing; Rolland, Jannick P.
Freeform Optics Metrology Using Optical Coherence Tomography Conference
Optical Fabrication and Testing, OSA 2014.
Abstract | Links | BibTeX | Tags: metrology, related
@conference{Yao2014,
title = {Freeform Optics Metrology Using Optical Coherence Tomography},
author = {Jianing Yao and Jannick P. Rolland },
doi = {https://doi.org/10.1364/OFT.2014.OW3B.4},
year = {2014},
date = {2014-06-25},
urldate = {2014-06-25},
booktitle = {Optical Fabrication and Testing},
organization = {OSA},
abstract = {We investigate the capability of a custom Fourier-domain swept-source optical coherence tomography method for non-contact freeform optics metrology. First results demonstrate the feasibility of measurement of an Alvarez surface with 400 µm sag.},
keywords = {metrology, related},
pubstate = {published},
tppubtype = {conference}
}
We investigate the capability of a custom Fourier-domain swept-source optical coherence tomography method for non-contact freeform optics metrology. First results demonstrate the feasibility of measurement of an Alvarez surface with 400 µm sag.