2021
Nikolov, Daniel K.; Bauer, Aaron; Cheng, Fei; Kato, Hitoshi; Vamivakas, A. Nick; Rolland, Jannick P.
Metaform optics: Bridging nanophotonics and freeform optics Journal Article
In: Science Advances, vol. 7, no. 18, pp. eabe5112, 2021.
Abstract | Links | BibTeX | Tags: Aberration correction, augmented reality, CeFO manufacturing, CEFO metrology, freeform, head display, Image quality, Optical design, relay optics, rolland, tomography
@article{nokey,
title = {Metaform optics: Bridging nanophotonics and freeform optics},
author = {Daniel K. Nikolov and Aaron Bauer and Fei Cheng and Hitoshi Kato and A. Nick Vamivakas and Jannick P. Rolland},
url = {https://www.science.org/doi/abs/10.1126/sciadv.abe5112},
doi = {10.1126/sciadv.abe5112},
year = {2021},
date = {2021-04-30},
urldate = {2021-04-30},
journal = {Science Advances},
volume = {7},
number = {18},
pages = {eabe5112},
abstract = {The demand for high-resolution optical systems with a compact form factor, such as augmented reality displays, sensors, and mobile cameras, requires creating new optical component architectures. Advances in the design and fabrication of freeform optics and metasurfaces make them potential solutions to address the previous needs. Here, we introduce the concept of a metaform—an optical surface that integrates the combined benefits of a freeform optic and a metasurface into a single optical component. We experimentally realized a miniature imager using a metaform mirror. The mirror is fabricated via an enhanced electron beam lithography process on a freeform substrate. The design degrees of freedom enabled by a metaform will support a new generation of optical systems.},
keywords = {Aberration correction, augmented reality, CeFO manufacturing, CEFO metrology, freeform, head display, Image quality, Optical design, relay optics, rolland, tomography},
pubstate = {published},
tppubtype = {article}
}
The demand for high-resolution optical systems with a compact form factor, such as augmented reality displays, sensors, and mobile cameras, requires creating new optical component architectures. Advances in the design and fabrication of freeform optics and metasurfaces make them potential solutions to address the previous needs. Here, we introduce the concept of a metaform—an optical surface that integrates the combined benefits of a freeform optic and a metasurface into a single optical component. We experimentally realized a miniature imager using a metaform mirror. The mirror is fabricated via an enhanced electron beam lithography process on a freeform substrate. The design degrees of freedom enabled by a metaform will support a new generation of optical systems.
Di Xu, * Zhenkun Wen; Rolland, Jannick P.
Verification of cascade optical coherence tomography for freeform optics form metrology Journal Article
In: Optics Express, vol. 29, no. 6, pp. 8542-8552, 2021.
Abstract | Links | BibTeX | Tags: CeFO, CEFO metrology, coherence, freeform, tomography
@article{XU2021b,
title = {Verification of cascade optical coherence tomography for freeform optics form metrology},
author = {Di Xu,,* Zhenkun Wen, Andres Garcia Coleto, Michael
Pomerantz, John C. Lambropoulos, 2 and Jannick P.
Rolland},
url = {https://opg.optica.org/oe/fulltext.cfm?uri=oe-29-6-8542&id=448922},
doi = {https://doi.org/10.1364/OE.413844},
year = {2021},
date = {2021-03-05},
urldate = {2021-03-05},
journal = {Optics Express},
volume = {29},
number = {6},
pages = {8542-8552},
abstract = {Freeform optical components enable dramatic advances for optical systems in both
performance and packaging. Surface form metrology of manufactured freeform optics remains
a challenge and an active area of research. Towards addressing this challenge, we previously
reported on a novel architecture, cascade optical coherence tomography (C-OCT), which was
validated for its ability of high-precision sag measurement at a given point. Here, we demonstrate
freeform surface measurements, enabled by the development of a custom optical-relay-based
scanning mechanism and a unique high-speed rotation mechanism. Experimental results on a flat
mirror demonstrate an RMS flatness of 14 nm (∼λ/44 at the He-Ne wavelength). Measurement
on a freeform mirror is achieved with an RMS residual of 69 nm (∼λ/9). The system-level
investigations and validation provide the groundwork for advancing C-OCT as a viable freeform
metrology technique.
},
keywords = {CeFO, CEFO metrology, coherence, freeform, tomography},
pubstate = {published},
tppubtype = {article}
}
Freeform optical components enable dramatic advances for optical systems in both
performance and packaging. Surface form metrology of manufactured freeform optics remains
a challenge and an active area of research. Towards addressing this challenge, we previously
reported on a novel architecture, cascade optical coherence tomography (C-OCT), which was
validated for its ability of high-precision sag measurement at a given point. Here, we demonstrate
freeform surface measurements, enabled by the development of a custom optical-relay-based
scanning mechanism and a unique high-speed rotation mechanism. Experimental results on a flat
mirror demonstrate an RMS flatness of 14 nm (∼λ/44 at the He-Ne wavelength). Measurement
on a freeform mirror is achieved with an RMS residual of 69 nm (∼λ/9). The system-level
investigations and validation provide the groundwork for advancing C-OCT as a viable freeform
metrology technique.
performance and packaging. Surface form metrology of manufactured freeform optics remains
a challenge and an active area of research. Towards addressing this challenge, we previously
reported on a novel architecture, cascade optical coherence tomography (C-OCT), which was
validated for its ability of high-precision sag measurement at a given point. Here, we demonstrate
freeform surface measurements, enabled by the development of a custom optical-relay-based
scanning mechanism and a unique high-speed rotation mechanism. Experimental results on a flat
mirror demonstrate an RMS flatness of 14 nm (∼λ/44 at the He-Ne wavelength). Measurement
on a freeform mirror is achieved with an RMS residual of 69 nm (∼λ/9). The system-level
investigations and validation provide the groundwork for advancing C-OCT as a viable freeform
metrology technique.