Congratulations to Professor Jonathan Ellis of the University of Rochester who was recently awarded an NSF career award (beginning March 15th, 2017 – February 28th, 2022) in the amount of $500,000. The award is part of the NSF’s Faculty Early Career Development Program. Prof. Ellis’s proposal was on “Breaking the freeform optics metrology barrier with synthetic wavelength interferometry.” The project will empower optical designers and manufacturers with metrology methodologies that can measure advanced freeform optics. Prof. Ellis will continue to work on his related CeFO project, leveraging the latter with this new award. This will allow Ellis to have two students advancing his research portfolio on this topic.