The Center for Freeform Optics
An Industry/University Cooperative Research Center

Zygo NewView scanning white light interferometer

M4_Zygo_newviewZygo NewView™ 7300 at University of Rochester and UNC-Charlotte.

Scanning white light interferometer for non-contact measurement of waviness and finish; Profile heights ranging from < 1 nm up to 20000 μm at high speeds, independent of surface texture, magnification, or feature height.